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Megan Canavan

Postgraduate Student


Research

The development of novel TEM sample preparation methods for reducing FIB induced damage: dopant profiling of gallium focused ion beam and helium ion beam milled semiconductors.

I am an Irish Research Council for Science, Engineering and Technology (IRCSET) postgraduate student working on an AMBER funded project, focusing on the characterisation of semiconducting nanostructures by advanced electron microscopy and ion beam technologies.

I received my BA (Hons) in Physics from Trinity College Dublin in 2013.

megan
Characterisation of semiconducting nanostructures by advanced electron microscopy and ion beam technologies

Publications

Title:
Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy
Authors:
T. J. Pennycook, L. Jones, H. Pettersson, J. Coelho, M. Canavan, B. Mendoza-Sanchez, V. Nicolosi and P. D. Nellist
Source:
Sci. Rep., 4, 7555; DOI:10.1038/srep07555 (2014).

Contact

School of Physics and CRANN
E-mail: mcanava@tcd.ie


Last updated 1 February 2018 physics@tcd.ie (Email).